Characterization of Two-Dimensional Materials with Atomic Force Microscopy

This webcast will begin with a brief introduction to the many capabilities that Atomic Force Microscopy (AFM) provides for 2D materials research, illustrated by examples from recent research to provide a broad overview of how AFM is helping to advance our understanding of these materials.

You will learn advanced methods to study interfacial structures and properties of graphene and beyond.

Dr. Zhihai Cheng, Professor of Physics at Renmin University of China, will then present results from several of his group’s research projects on the interfacial structures and properties of 2D Materials, including a study of strain-induced anisotropic shear behaviour, visualization and effects of water-intercalation at the homo-/hetero-interfaces, and interfacial strain-induced patterned mechanical and electronical structures at a MoS2/SiO2 and WS2/SiO2 interface.

You will learn how AFM can:

• Resolve the structure of 2D materials to evaluate their preparation and modification
• Measure and map the unique electrical and mechanical properties of 2D materials
• Evaluate the performance of 2D materials incorporated within proposed devices