Online Virology Symposium: Applications of Atomic Force Microscopy in Virology Research

Channel: AFM
Description: This webinar will show how we can help you manufacture high quality semiconductor devices using etch and deposition techniques. We will then explore innovative imaging and analysis techniques to understand and confirm that the device contains the desired properties. Finally, we will cover techniques used to identify device defects and analyze device failures.

Author: AFM

Key learning objectives:

• Plasma techniques for constructing devices

• Optimizing semiconductor device manufacture using etch and deposition processes

• Using AFM & EDS for process control and failure analysis

• Understanding the construction of semiconductor devices at the nanoscale

This webinar offers solutions from mulitple Oxford Instruments business units: